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Beilstein J. Nanotechnol. 2011, 2, 293–301, doi:10.3762/bjnano.2.34
Figure 1: SEM images of aligned CNTs prepared at different temperatures (a) 650 °C, (b) 750 °C, (c) 850 °C, (...
Figure 2: (a) SEM image of aligned CNTs on a quartz substrate. (b) SEM image of an isolated mat collected fro...
Figure 3: X-ray diffraction (XRD) of aligned MWCNTs on quartz substrate prepared at (a) 650 °C and (b) 1100 °...
Figure 4: TEM images of aligned CNTs prepared at (a) 650 °C, (b) 750 °C, (c) 850 °C, (d) 950 °C, (e) 1000 °C,...
Figure 5: HRTEM images of MWCNTs prepared at (a) 650 °C, (b) 750 °C, (c) 850 °C, (d) 950 °C, (e) 1000 °C, and...
Figure 6: AFM image of isolated CNTs prepared at (a) 650 °C and (b) 1100 °C. The scan area is 15 μm × 15 μm a...
Figure 7: SAXS pattern of aligned CNTs prepared at (a) 1100 °C and (b) 650 °C. SEM images of aligned CNTs pre...
Figure 8: (a) Raman spectra and (b) TGA curves of aligned CNTs prepared at 650 and 1100 °C.